HU, Anlin, FENG, Wenjiang, ZHU, Xudong, WANG, Junjie, AO, Yiping und FENG, Hao, 2025. Meta GAN: Metamorphic GAN-Based Augmentation for Improving Deep Learning-Based Multiple-Fault Localization Without Test Oracles. Electronics (2079-9292). 1 Juli 2025. Vol. 14, no. 13, p. 2596-2621. DOI 10.3390/electronics14132596.
Elsevier - Harvard (with titles)Hu, A., Feng, W., Zhu, X., Wang, J., Ao, Y., Feng, H., 2025. Meta GAN: Metamorphic GAN-Based Augmentation for Improving Deep Learning-Based Multiple-Fault Localization Without Test Oracles. Electronics (2079-9292) 14, 2596-2621. https://doi.org/10.3390/electronics14132596
American Psychological Association 7th editionHu, A., Feng, W., Zhu, X., Wang, J., Ao, Y., & Feng, H. (2025). Meta GAN: Metamorphic GAN-Based Augmentation for Improving Deep Learning-Based Multiple-Fault Localization Without Test Oracles. Electronics (2079-9292), 14(13), 2596-2621. https://doi.org/10.3390/electronics14132596
Springer - Basic (author-date)Hu A, Feng W, Zhu X, Wang J, Ao Y, Feng H (2025) Meta GAN: Metamorphic GAN-Based Augmentation for Improving Deep Learning-Based Multiple-Fault Localization Without Test Oracles.. Electronics (2079-9292) 14:2596-2621. https://doi.org/10.3390/electronics14132596
Juristische Zitierweise (Stüber) (Deutsch)Hu, Anlin/ Feng, Wenjiang/ Zhu, Xudong/ Wang, Junjie/ Ao, Yiping/ Feng, Hao, Meta GAN: Metamorphic GAN-Based Augmentation for Improving Deep Learning-Based Multiple-Fault Localization Without Test Oracles., Electronics (2079-9292) 2025, 2596-2621.