WANG, Kang, LIU, Lanqing, XU, Cheng, ZOU, Jing, LIN, Haoneng, FANG, Naiyu und JIANG, Jingchao, 2026. Towards label-free defect detection in additive manufacturing via dual-classifier semi-supervised learning for vision-language models. Journal of Intelligent Manufacturing. 1 März 2026. Vol. 37, no. 3, p. 1163-1178. DOI 10.1007/s10845-025-02589-2.
Elsevier - Harvard (with titles)Wang, K., Liu, L., Xu, C., Zou, J., Lin, H., Fang, N., Jiang, J., 2026. Towards label-free defect detection in additive manufacturing via dual-classifier semi-supervised learning for vision-language models. Journal of Intelligent Manufacturing 37, 1163-1178. https://doi.org/10.1007/s10845-025-02589-2
American Psychological Association 7th editionWang, K., Liu, L., Xu, C., Zou, J., Lin, H., Fang, N., & Jiang, J. (2026). Towards label-free defect detection in additive manufacturing via dual-classifier semi-supervised learning for vision-language models. Journal of Intelligent Manufacturing, 37(3), 1163-1178. https://doi.org/10.1007/s10845-025-02589-2
Springer - Basic (author-date)Wang K, Liu L, Xu C, Zou J, Lin H, Fang N, Jiang J (2026) Towards label-free defect detection in additive manufacturing via dual-classifier semi-supervised learning for vision-language models.. Journal of Intelligent Manufacturing 37:1163-1178. https://doi.org/10.1007/s10845-025-02589-2
Juristische Zitierweise (Stüber) (Deutsch)Wang, Kang/ Liu, Lanqing/ Xu, Cheng/ Zou, Jing/ Lin, Haoneng/ Fang, Naiyu/ Jiang, Jingchao, Towards label-free defect detection in additive manufacturing via dual-classifier semi-supervised learning for vision-language models., Journal of Intelligent Manufacturing 2026, 1163-1178.