LEE, Wei-Hong, CHEN, Chih-Cheng und JIANG, Jin, 2026. Large Language Model-guided Data Augmentation for You Only Look Once Version 8-based Printed Circuit Board Defect Detection: Novel Human--AI Codesign Approach. Sensors & Materials. 15 Februar 2026. Vol. 38, no. 2, Part 3, p. 935-952. DOI 10.18494/SAM5789.
Elsevier - Harvard (with titles)Lee, W.-H., Chen, C.-C., Jiang, J., 2026. Large Language Model-guided Data Augmentation for You Only Look Once Version 8-based Printed Circuit Board Defect Detection: Novel Human--AI Codesign Approach. Sensors & Materials 38, 935-952. https://doi.org/10.18494/SAM5789
American Psychological Association 7th editionLee, W.-H., Chen, C.-C., & Jiang, J. (2026). Large Language Model-guided Data Augmentation for You Only Look Once Version 8-based Printed Circuit Board Defect Detection: Novel Human--AI Codesign Approach. Sensors & Materials, 38(2, Part 3), 935-952. https://doi.org/10.18494/SAM5789
Springer - Basic (author-date)Lee W-H, Chen C-C, Jiang J (2026) Large Language Model-guided Data Augmentation for You Only Look Once Version 8-based Printed Circuit Board Defect Detection: Novel Human--AI Codesign Approach.. Sensors & Materials 38:935-952. https://doi.org/10.18494/SAM5789
Juristische Zitierweise (Stüber) (Deutsch)Lee, Wei-Hong/ Chen, Chih-Cheng/ Jiang, Jin, Large Language Model-guided Data Augmentation for You Only Look Once Version 8-based Printed Circuit Board Defect Detection: Novel Human--AI Codesign Approach., Sensors & Materials 2026, 935-952.