*Result*: Survey on Machine Learning Algorithms Enhancing the Functional Verification Process

*Published in*:
Enthalten in: Electronics. - 2021. - 10.3390/electronics10212688. - ISSN 2079-9292. - Jahrgang 10, Heft 21
*Publication*:
Basel : MDPI, 2022
*Distribution*:
Darmstadt : Universitäts- und Landesbibliothek Darmstadt
*Physical description scale*:
1 Online-Ressource (24 Seiten)
*Format*:
*eBook*
*Language*:
*eng*
*Notes*:
kostenfrei
*DOI*:
10.26083/tuprints-00020072
*oa_rights*:
Open Access
CC BY 4.0